SHANGHAI INFOCROPS SCIENCE & TECHNOLOGY CO., LIMITED
Catalog
NEWS
PRODUCT
TECHNOLOGY
COURSE
Latest

Femtosecond Pulse Focusing

Pulse Focusing with High-NA Lens

Optimal Working Distance for Couplin

Comparison of Different Lenses for F

Import Optical Systems from Zemax Op

Cross-Platform Optical Modeling and

Mach-Zehnder Interferometer

Fizeau Interferometer for Optical Te

White-Light Michelson Interferometer

Full-Field Optical Coherence Scannin

Position : Home > TECHNOLOGY > VirtualLab >
Full-Field Optical Coherence Scanning Interferometry
Time: 2019-11-22 18:13Source: infocrops.comWriter: infocrops
Scanning interferometry is the technique for performing surface height measurement. By exploiting the low coherence of white light source, interference pattern appears only when the path length difference is within the coherent length. Therefore, it enables precise microscopic measurement. Together with a Xenon lamp, a Michelson interferometer is built up and used to measure a specimen with smoothly varying front surface.

 
ABOUT US NEWS PRODUCT SERVICES CONTACTS   INFOCROPS
AddRoom 408, Building 7, Yong Deng Business Plaza, No. 277, Yongdeng Road, Putuo District, Shanghai
Tel86 21-64860708
Fax86 21-64860709
MAILinfo@infocrops.com
INTRODUCTION company news VirtualLab Software Training contacts us
honor profession news FRED Special Topic Training COOPERATION
history   Comet Special Topic Training join us
Copyright © 2018 SHANGHAI INFOCROPS SCIENCE & TECHNOLOGY CO., LIMITED,All Rights Reserved.